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Fault Tolerance of Data Center under Multi-Correlated Failures

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dc.contributor.author Ali, S. M.
dc.contributor.author Tareen, Nauman Khan
dc.contributor.author Sami, Irfan
dc.contributor.author Zahid Ullah
dc.contributor.author Khan, Khalid Salman
dc.contributor.author Farid, Umar
dc.contributor.author Khan, Bilal
dc.contributor.author Mehmood, C. A.
dc.contributor.author Jawad, M.
dc.date.accessioned 2019-11-18T10:06:45Z
dc.date.available 2019-11-18T10:06:45Z
dc.date.issued 2018-10-17
dc.identifier.isbn 978-1-5386-8204-3
dc.identifier.uri http://142.54.178.187:9060/xmlui/handle/123456789/1460
dc.description.abstract Multi-correlated failures lead to severe power outages in an inter-connected power network. The critical loads of the data center, such as servers and chillers are highly dependent on the grid power. The service reliability and fault tolerance of the data center becomes challenging under multi-correlated failures. Data miss-management and service unavailability under such scenario will result in the massive revenue loss. To address this problem under multi-correlated failures, a fault tolerant model is proposed to minimize the revenue loss. Moreover, considering the system dynamics, our model maximizes throughput and operational time of the data center. Furthermore, we formulate a stochastic optimized system model that captures power consumption, power distribution, data center generation, data center workload, service deadline, and revenue loss. The effectiveness of the proposed fault-tolerant model is tested and validated using real-time data. en_US
dc.language.iso en_US en_US
dc.publisher IEEE International Symposium on Recent Advances in Electrical Engineering (RAEE) en_US
dc.subject Engineering and Technology en_US
dc.subject Electrical engineering en_US
dc.subject Servers en_US
dc.subject Data centers en_US
dc.subject Reliability en_US
dc.subject Power system reliability en_US
dc.subject Power demand en_US
dc.subject Fault tolerant systems en_US
dc.title Fault Tolerance of Data Center under Multi-Correlated Failures en_US
dc.type Proceedings en_US


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