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Growth and electrical characterization of Cr–Lu2O3–Cr MIM structure by electron beam evaporation technique

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dc.contributor.author Mahmood, Khalid
dc.contributor.author Akbar, Shahnaz
dc.contributor.author Ramzan, M
dc.contributor.author Wasiq, M F
dc.contributor.author r Khan, Muhammad Azha
dc.date.accessioned 2020-01-01T07:00:26Z
dc.date.available 2020-01-01T07:00:26Z
dc.date.issued 2018-10-10
dc.identifier.issn 6 016405
dc.identifier.uri http://142.54.178.187:9060/xmlui/handle/123456789/2065
dc.description.abstract In this paper, we have grown Cr–Lu2O3–Cr structure on glass substrate by electron beam evaporation technique. The electrical characterization of grown MIM diode was performed by temperature dependent current-voltage (I–V) characteristics in between 320–405 K. The electrical measurements revealed that schottky emission conduction mechanism is dominant across the metal-dielectric diode. The further justification in favor of schottky emission was provided by plotting the schottky and Arrhenius plots which show linear behavior. From these graphs we have calculated the temperature dependent dielectric constant whose value is in good agreement with the reported value of lutetium oxide dielectric constant. We have tested the possibility F-N tunneling and Poole-Frankel emission conduction mechanisms and found that these mechanisms are not operative in the diodes under investigation. Activation energy versus V1/2 graph was also plotted to further justify our argument. en_US
dc.language.iso en_US en_US
dc.subject Natural Science en_US
dc.subject Growth and electrical characterization en_US
dc.subject Cr–Lu2O3–Cr MIM en_US
dc.subject electron beam en_US
dc.subject evaporation technique en_US
dc.title Growth and electrical characterization of Cr–Lu2O3–Cr MIM structure by electron beam evaporation technique en_US
dc.type Article en_US


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