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IMPROVED TECHNIQUES TO OBTAIN FAULT-TOLERANT SEMICONDUCTOR MEMORIES BASED ON ERROR-CONTROL CODING
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| dc.contributor.author | Mukati, Mohammad Altaf | |
| dc.date.accessioned | 2018-01-05T06:07:26Z | |
| dc.date.accessioned | 2020-04-11T15:33:10Z | |
| dc.date.available | 2020-04-11T15:33:10Z | |
| dc.date.issued | 2006 | |
| dc.identifier.uri | http://142.54.178.187:9060/xmlui/handle/123456789/4829 | |
| dc.description.abstract | N/A | en_US |
| dc.description.sponsorship | Higher Education Commission, Pakistan | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | HAMDARD UNIVERSITY | en_US |
| dc.subject | Computer science, Knowledge & systems | en_US |
| dc.title | IMPROVED TECHNIQUES TO OBTAIN FAULT-TOLERANT SEMICONDUCTOR MEMORIES BASED ON ERROR-CONTROL CODING | en_US |
| dc.type | Thesis | en_US |
